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US Patent Issued to NANYA TECHNOLOGY on Nov. 3 for "Method of testing semiconductor device" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,393, issued on Nov. 3, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan). "Method of testing semiconductor device" was invent... Read More


US Patent Issued to Intelligent Memory on Nov. 3 for "Multiple tile wafer tester" (Chinese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,394, issued on Nov. 3, was assigned to Intelligent Memory Ltd. (Kwai Chung, Hong Kong). "Multiple tile wafer tester" was invented by Peter P... Read More


US Patent Issued to MPI on Nov. 3 for "Membrane probe card, method of making the same and method of making tested semiconductor chip by using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,395, issued on Nov. 3, was assigned to MPI Corp. (Chu-Pei City, Taiwan). "Membrane probe card, method of making the same and method of makin... Read More


US Patent Issued to ISABELLENHUETTE HEUSLER on Nov. 3 for "Current measuring resistor using a resistor element formed between two conduction elements with an associated circuit board and method of making the same" (German Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,396, issued on Nov. 3, was assigned to ISABELLENHUETTE HEUSLER GMBH & Co. KG (Dillenburg, Germany). "Current measuring resistor using a resi... Read More


US Patent Issued to Analog Devices International UnLtd. on Nov. 3 for "Current sensor" (British, Irish Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,397, issued on Nov. 3, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland). "Current sensor" was invented by Bailey ... Read More


US Patent Issued to Allegro MicroSystems on Nov. 3 for "MR layout for current measurement" (American, French Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,398, issued on Nov. 3, was assigned to Allegro MicroSystems LLC (Manchester, N.H.). "MR layout for current measurement" was invented by Yann... Read More


US Patent Issued to Korea Advanced Institute of Science and Technology on Nov. 3 for "Zero current detection device" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,399, issued on Nov. 3, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea). "Zero current detection de... Read More


US Patent Issued to SCHNEIDER ELECTRIC USA on Nov. 3 for "Systems and methods for improving identification of issues associated with detecting anomalous conditions" (Tennessee Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,400, issued on Nov. 3, was assigned to SCHNEIDER ELECTRIC USA INC. (Boston). "Systems and methods for improving identification of issues ass... Read More


US Patent Issued to Hitachi on Nov. 3 for "Aggregator system" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,401, issued on Nov. 3, was assigned to Hitachi Ltd. (Tokyo). "Aggregator system" was invented by Tomoya Yamasaki (Tokyo), Noriyuki Takeshita... Read More


US Patent Issued to Bayerische Motoren Werke on Nov. 3 for "Method and device for determining charging information with regard to a charging operation" (German Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,402, issued on Nov. 3, was assigned to Bayerische Motoren Werke AG (Munich). "Method and device for determining charging information with re... Read More